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"Test Chip for Identifying Spice-Parameters of Cryogenic BiFET Circuits."
Oleg V. Dvornikov et al. (2019)
- Oleg V. Dvornikov, Nikolay N. Prokopenko, Vladimir A. Tchekhovski, Yaroslav D. Galkin, Alexei V. Kunz, Anna V. Bugakova:
Test Chip for Identifying Spice-Parameters of Cryogenic BiFET Circuits. ESSDERC 2019: 102-105
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