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"Test Chip for Identifying Spice-Parameters of Cryogenic BiFET Circuits."

Oleg V. Dvornikov et al. (2019)

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DOI: 10.1109/ESSDERC.2019.8901773

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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  dblp key:
  - conf/essderc/DvornikovPTGKB19
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  - https://dblp.org/rec/conf/essderc/DvornikovPTGKB19
Oleg V. Dvornikov, Nikolay N. Prokopenko, Vladimir A. Tchekhovski, Yaroslav D. Galkin, Alexei V. Kunz, Anna V. Bugakova:
Test Chip for Identifying Spice-Parameters of Cryogenic BiFET Circuits. ESSDERC 2019: 102-105

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