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"Effect of surface roughness and phonon scattering on extremely narrow ..."

Hamilton Carrillo-Nunez et al. (2016)

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DOI: 10.1109/ESSDERC.2016.7599618

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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  - conf/essderc/Carrillo-NunezR16
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Hamilton Carrillo-Nunez, Reto Rhyner, Mathieu Luisier, Andreas Schenk:
Effect of surface roughness and phonon scattering on extremely narrow InAs-Si Nanowire TFETs. ESSDERC 2016: 188-191

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