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"Sensitivity-based investigation of threshold voltage variability in 32-nm ..."

Valentina Bonfiglio, Giuseppe Iannaccone (2012)

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DOI: 10.1109/ESSDERC.2012.6343347

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-02

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Valentina Bonfiglio, Giuseppe Iannaccone:
Sensitivity-based investigation of threshold voltage variability in 32-nm flash memory cells. ESSDERC 2012: 117-120

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