"Comprehensive statistical comparison of RTN and BTI in deeply scaled ..."

Salvatore M. Amoroso et al. (2012)

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DOI: 10.1109/ESSDERC.2012.6343345

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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Salvatore M. Amoroso, Louis Gerrer, Stanislav Markov, Fikru Adamu-Lema, Asen Asenov:
Comprehensive statistical comparison of RTN and BTI in deeply scaled MOSFETs by means of 3D 'atomistic' simulation. ESSDERC 2012: 109-112

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