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"Electron delay analysis and image charge effect in AlGaN/GaN HEMT on ..."
Alain Agboton et al. (2013)
- Alain Agboton, Nicolas Defrance, Phillipe Altuntas, Vannessa Avramovic, Adrien Cutivet, Rezky Ouhachi, Jean-Claude de Jaeger, Samira Bouzid-Driad, Hassan Maher, Michel Renvoise, Peter Frijlink:
Electron delay analysis and image charge effect in AlGaN/GaN HEMT on silicon substrate. ESSDERC 2013: 57-60
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