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"A BIST structure for the evaluation of the MOSFET gate dielectric ..."

Norman Dodel et al. (2015)

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DOI: 10.1109/ESSCIRC.2015.7313915

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Norman Dodel, Stefan Keil, Andreas Wiemhofer, Malte Kortstock, Philipp Scholz, Uwe Kerst, Roland Thewes:
A BIST structure for the evaluation of the MOSFET gate dielectric interface state density in post-processed CMOS chips. ESSCIRC 2015: 412-415

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