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"Analyzing static noise margin for sub-threshold SRAM in 65nm CMOS."

Benton H. Calhoun, Anantha P. Chandrakasan (2005)

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DOI: 10.1109/ESSCIR.2005.1541635

access: closed

type: Conference or Workshop Paper

metadata version: 2023-04-28

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  - conf/esscirc/CalhounC05
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Benton H. Calhoun, Anantha P. Chandrakasan:
Analyzing static noise margin for sub-threshold SRAM in 65nm CMOS. ESSCIRC 2005: 363-366

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