"High precision optical angle measuring method applicable in standard CMOS ..."

Christian Koch, Jürgen Oehm, Andreas Gornik (2009)

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DOI: 10.1109/ESSCIRC.2009.5325982

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-07

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Christian Koch, Jürgen Oehm, Andreas Gornik:
High precision optical angle measuring method applicable in standard CMOS technology. ESSCIRC 2009: 244-247

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