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"Reliability and stability analysis and crack estimation of semiconductor ..."

Jiseong Lee, Yong Sin Kim (2021)

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DOI: 10.1109/ICEIC51217.2021.9369727

access: closed

type: Conference or Workshop Paper

metadata version: 2021-03-26

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Jiseong Lee, Yong Sin Kim:
Reliability and stability analysis and crack estimation of semiconductor gas sensors heater. ICEIC 2021: 1-3

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