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"Optimizing Gate Insulator Conditions via Interfacial Oxidation in Vertical ..."

Sang Hun Hwang et al. (2024)

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DOI: 10.1109/ICEIC61013.2024.10457204

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-02

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  dblp key:
  - conf/elinfocom/HwangHHMLB24
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  - https://dblp.org/rec/conf/elinfocom/HwangHHMLB24
Sang Hun Hwang, Byung Seol Hwang, Sang Ho Hwang, Seung Jae Moon, Jong Mo Lee, Byung Seong Bae:
Optimizing Gate Insulator Conditions via Interfacial Oxidation in Vertical Structure TFTs. ICEIC 2024: 1-4

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