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"Research on IGBT reliability method based on SSA-BP."

Hailin Hu, Jun Chen, Weijin Chen (2022)

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DOI: 10.1145/3573428.3573430

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-03

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  dblp key:
  - conf/eitce/HuCC22
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  - https://dblp.org/rec/conf/eitce/HuCC22
Hailin Hu, Jun Chen, Weijin Chen:
Research on IGBT reliability method based on SSA-BP. EITCE 2022: 5-9

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