"On-chip at-speed linearity testing of high-resolution high-speed DACs ..."

Hanqing Xing, Degang Chen, Randall L. Geiger (2008)

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DOI: 10.1109/EIT.2008.4554278

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-26

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Hanqing Xing, Degang Chen, Randall L. Geiger:
On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering. EIT 2008: 117-122

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