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"Characterization, Modelling and Measurement of Device Imperfections in ..."
Zhenning Tao et al. (2021)
- Zhenning Tao, Yangyang Fan, Tong Ye, Xiaofei Su, Hisao Nakashima, Takeshi Hoshida:
Characterization, Modelling and Measurement of Device Imperfections in Advanced Coherent Transceivers. ECOC 2021: 1-4
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