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"Negative Margin Matters: Understanding Margin in Few-Shot Classification."

Bin Liu et al. (2020)

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DOI: 10.1007/978-3-030-58548-8_26

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-05

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  dblp key:
  - conf/eccv/LiuCLL0LH20
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  - https://dblp.org/rec/conf/eccv/LiuCLL0LH20
Bin Liu, Yue Cao, Yutong Lin, Qi Li, Zheng Zhang, Mingsheng Long, Han Hu:
Negative Margin Matters: Understanding Margin in Few-Shot Classification. ECCV (4) 2020: 438-455

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