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"Exploring Trial-Level Reliability of Short-Term Memory Effects in ..."

Winston D. Goh (2015)

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DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2023-03-10

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  - electronic edition @ ceur-ws.org (open access)
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  dblp key:
  - conf/eapcogsci/Goh15
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  - https://dblp.org/rec/conf/eapcogsci/Goh15
Winston D. Goh:
Exploring Trial-Level Reliability of Short-Term Memory Effects in Immediate Serial Recall. EAPCogSci 2015

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