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"Numerical approach to predict power device reliability."

Alessandro Sitta et al. (2018)

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DOI: 10.1109/DTIS.2018.8368577

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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  - conf/dtis/SittaRBC0C18
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Alessandro Sitta, Sebastiano Russo, Gaetano Bazzano, Daniela Cavallaro, Giuseppe Greco, Michele Calabretta:
Numerical approach to predict power device reliability. DTIS 2018: 1-5

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