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"A fully contactless wafer-level testing for UHF RFID tag with on-chip antenna."

Alessandro Finocchiaro et al. (2018)

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DOI: 10.1109/DTIS.2018.8368554

access: closed

type: Conference or Workshop Paper

metadata version: 2018-06-14

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  - conf/dtis/FinocchiaroGMPP18
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Alessandro Finocchiaro, Giovanni Girlando, Alessandro Motta, Alberto Pagani, Giuseppe Palmisano:
A fully contactless wafer-level testing for UHF RFID tag with on-chip antenna. DTIS 2018: 1-6

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