"Statistical modelling of analog circuits for test metrics computation."

Kamel Beznia et al. (2013)

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DOI: 10.1109/DTIS.2013.6527772

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-22

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Kamel Beznia, Ahcène Bounceur, Salvador Mir, Reinhardt Euler:
Statistical modelling of analog circuits for test metrics computation. DTIS 2013: 25-29

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