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"Massive statistical process variations: A grand challenge for testing ..."
Bernd Becker et al. (2010)
- Bernd Becker
, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, Hans-Joachim Wunderlich:
Massive statistical process variations: A grand challenge for testing nanoelectronic circuits. DSN Workshops 2010: 95-100
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