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"SMART: Investigating the Impact of Threshold Voltage Suppression in an ..."

Saeed Seyedfaraji, Baset Mesgari, Semeen Rehman (2022)

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DOI: 10.1109/DSD57027.2022.00115

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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Saeed Seyedfaraji, Baset Mesgari, Semeen Rehman:
SMART: Investigating the Impact of Threshold Voltage Suppression in an In-SRAM Multiplication/Accumulation Accelerator for Accuracy Improvement in 65 nm CMOS Technology. DSD 2022: 821-826

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