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"Test Generation Approach for Post-Silicon Validation of High End ..."

Satish Kumar Sadasivam, Sangram Alapati, Varun Mallikarjunan (2012)

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DOI: 10.1109/DSD.2012.148

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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  - https://dblp.org/rec/conf/dsd/SadasivamAM12
Satish Kumar Sadasivam, Sangram Alapati, Varun Mallikarjunan:
Test Generation Approach for Post-Silicon Validation of High End Microprocessor. DSD 2012: 830-836

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