BibTeX record conf/dsd/RaikUKK07

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@inproceedings{DBLP:conf/dsd/RaikUKK07,
  author    = {Jaan Raik and
               Raimund Ubar and
               Anna Krivenko and
               Margus Kruus},
  title     = {Hierarchical Identification of Untestable Faults in Sequential Circuits},
  booktitle = {Tenth Euromicro Conference on Digital System Design: Architectures,
               Methods and Tools {(DSD} 2007), 29-31 August 2007, L{\"{u}}beck,
               Germany},
  pages     = {668--671},
  publisher = {{IEEE} Computer Society},
  year      = {2007},
  url       = {https://doi.org/10.1109/DSD.2007.4341539},
  doi       = {10.1109/DSD.2007.4341539},
  timestamp = {Sun, 25 Oct 2020 22:37:01 +0100},
  biburl    = {https://dblp.org/rec/conf/dsd/RaikUKK07.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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