"An On-Line BIST Technique for Stuck-Open Fault Detection in CMOS Circuits."

Elham K. Moghaddam, Shaahin Hessabi (2007)

> Home

Details and statistics

DOI: 10.1109/DSD.2007.4341532

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/dsd/MoghaddamH07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dsd/MoghaddamH07
Elham K. Moghaddam, Shaahin Hessabi:
An On-Line BIST Technique for Stuck-Open Fault Detection in CMOS Circuits. DSD 2007: 619-625

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.