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"UTEMS: A Unit Testing Scheme for Event-driven Microservices."

Shang-Pin Ma et al. (2023)

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DOI: 10.1109/DSA59317.2023.00085

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-24

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  dblp key:
  - conf/dsa/MaYLY23
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  - https://dblp.org/rec/conf/dsa/MaYLY23
Shang-Pin Ma, Yu-Yung Yang, Shin-Jie Lee, Hang-Wei Yeh:
UTEMS: A Unit Testing Scheme for Event-driven Microservices. DSA 2023: 591-592

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