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"CMOS Standard Cells Characterization for Defect Based Testing."
Witold A. Pleskacz et al. (2001)
- Witold A. Pleskacz, Dominik Kasprowicz, Tomasz Oleszczak, Wieslaw Kuzmicz:
CMOS Standard Cells Characterization for Defect Based Testing. DFT 2001: 384-
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