"On the design of two single event tolerant slave latches for scan delay ..."

Yang Lu et al. (2012)

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DOI: 10.1109/DFT.2012.6378202

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yang Lu, Fabrizio Lombardi, Salvatore Pontarelli, Marco Ottavi:
On the design of two single event tolerant slave latches for scan delay testing. DFT 2012: 67-72

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