"Parallel Testing of Multi-port Static Random Access Memories for BIST."

Farzin Karimi, Fabrizio Lombardi (2001)

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DOI: 10.1109/DFTVS.2001.966779

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Farzin Karimi, Fabrizio Lombardi:
Parallel Testing of Multi-port Static Random Access Memories for BIST. DFT 2001: 271-279

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