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"Realistic Fault Extraction for High-Quality Design and Test of VLSI Systems."

Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira (1997)

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DOI: 10.1109/DFTVS.1997.628306

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/dft/GoncalvesTT97
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  persistent URL:
  - https://dblp.org/rec/conf/dft/GoncalvesTT97
Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira:
Realistic Fault Extraction for High-Quality Design and Test of VLSI Systems. DFT 1997: 29-37

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