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"Analysis of the Effects of Single Event Upsets (SEUs) on User Memory in ..."

Zhen Gao et al. (2018)

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DOI: 10.1109/DFT.2018.8602988

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/dft/GaoYZHR18
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  persistent URL:
  - https://dblp.org/rec/conf/dft/GaoYZHR18
Zhen Gao, Lina Yan, Jinhua Zhu, Ruishi Han, Pedro Reviriego:
Analysis of the Effects of Single Event Upsets (SEUs) on User Memory in FPGA Implemented Viterbi Decoders. DFT 2018: 1-6

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