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"A Multiple Target Test Generation Method for Gate-Exhaustive Faults to ..."

Ryuki Asami et al. (2020)

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DOI: 10.1109/DFT50435.2020.9250810

access: closed

type: Conference or Workshop Paper

metadata version: 2020-11-17

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  dblp key:
  - conf/dft/AsamiHYA20
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Ryuki Asami, Toshinori Hosokawa, Masayoshi Yoshimura, Masayuki Arai:
A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the Number of Test Patterns Using Partial MaxSAT. DFT 2020: 1-6

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