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"Lifetime reliability characterization of N/MEMS used in power gating of ..."
Haider Alrudainy et al. (2017)
- Haider Alrudainy, Rishad A. Shafik, Andrey Mokhov, Alex Yakovlev:
Lifetime reliability characterization of N/MEMS used in power gating of digital integrated circuits. DFT 2017: 1-6
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