"Comprehensive Defect Analysis and Defect Coverage of CMOS Circuits."

Dhamin Al-Khalili et al. (1998)

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DOI: 10.1109/DFTVS.1998.732154

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/dft/Al-KhaliliARHR98
Dhamin Al-Khalili, Saman Adham, Côme Rozon, Moazzem Hossain, Douglas Racz:
Comprehensive Defect Analysis and Defect Coverage of CMOS Circuits. DFT 1998: 84-92

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