"23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI ..."

Cristiana Bolchini et al. (2008)

> Home

Details and statistics

DOI: —

access: closed

type: Editorship

metadata version: 2019-10-16

- view
- export record
  dblp key:
  - conf/dft/2008
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dft/2008
Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, Mohammad Tehranipoor:
23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA. IEEE Computer Society 2008, ISBN 978-0-7695-3365-0 [contents]

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.