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"23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI ..."
Cristiana Bolchini et al. (2008)
- Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, Mohammad Tehranipoor:
23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA. IEEE Computer Society 2008, ISBN 978-0-7695-3365-0 [contents]
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