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"Constraint-based test pattern generation at the Register-Transfer Level."
Taavi Viilukas et al. (2010)
- Taavi Viilukas, Jaan Raik, Maksim Jenihhin, Raimund Ubar, Anna Krivenko:
Constraint-based test pattern generation at the Register-Transfer Level. DDECS 2010: 352-357
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