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"A new hierarchical built-in self-test with on-chip diagnosis for VLIW ..."
Markus Ulbricht et al. (2011)
- Markus Ulbricht, Mario Schölzel, Tobias Koal, Heinrich Theodor Vierhaus:
A new hierarchical built-in self-test with on-chip diagnosis for VLIW processors. DDECS 2011: 143-146
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