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"On the test of single via related defects in digital VLSI designs."

Nunzio Mirabella, Maurizio Ricci, Michelangelo Grosso (2020)

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DOI: 10.1109/DDECS50862.2020.9095717

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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  dblp key:
  - conf/ddecs/MirabellaRG20
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  - https://dblp.org/rec/conf/ddecs/MirabellaRG20
Nunzio Mirabella, Maurizio Ricci, Michelangelo Grosso:
On the test of single via related defects in digital VLSI designs. DDECS 2020: 1-6

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