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"26th International Symposium on Design and Diagnostics of Electronic ..."

Maksim Jenihhin et al. (2023)

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DOI: 10.1109/DDECS57882.2023

access: closed

type: Editorship

metadata version: 2023-06-07

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  - https://dblp.org/rec/conf/ddecs/2023
Maksim Jenihhin, Hana Kubátová, Nele Metens, Jaan Raik, Foisal Ahmed, Jan Belohoubek:
26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023, Tallinn, Estonia, May 3-5, 2023. IEEE 2023, ISBN 979-8-3503-3277-3 [contents]

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