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"Estimation of the Optimal Accelerated Test Region for FinFET SRAMs ..."

Rui Zhang et al. (2018)

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DOI: 10.1109/DCIS.2018.8681492

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Rui Zhang, Kexin Yang, Taizhi Liu, Linda Milor:
Estimation of the Optimal Accelerated Test Region for FinFET SRAMs Degraded by Front-End and Back-End Wearout Mechanisms. DCIS 2018: 1-6

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