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"Reliability and Accelerated Testing of 14nm FinFET Ring Oscillators."

Shu-Han Hsu, Kexin Yang, Linda Milor (2019)

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DOI: 10.1109/DCIS201949030.2019.8959834

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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  dblp key:
  - conf/dcis/HsuYM19
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Shu-Han Hsu, Kexin Yang, Linda Milor:
Reliability and Accelerated Testing of 14nm FinFET Ring Oscillators. DCIS 2019: 1-7

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