"Capturing post-silicon variation by layout-aware path-delay testing."

Xiaolin Zhang et al. (2013)

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DOI: 10.7873/DATE.2013.071

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-22

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  - https://dblp.org/rec/conf/date/ZhangYH013
Xiaolin Zhang, Jing Ye, Yu Hu, Xiaowei Li:
Capturing post-silicon variation by layout-aware path-delay testing. DATE 2013: 288-291

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