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"Analysis and Minimization of Test Time in a Combined BIST and External ..."
Makoto Sugihara, Hiroto Yasuura, Hiroshi Date (2000)
- Makoto Sugihara, Hiroto Yasuura, Hiroshi Date:
Analysis and Minimization of Test Time in a Combined BIST and External Test Approach. DATE 2000: 134-140
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