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"CCII+ current conveyor based BIC monitor for IDDQ testing of ..."
Viera Stopjaková, Hans A. R. Manhaeve (1997)
- Viera Stopjaková, Hans A. R. Manhaeve:
CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits. ED&TC 1997: 266-270
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