"An effective approach to automatic functional processor test generation ..."

Andreas Riefert et al. (2014)

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DOI: 10.7873/DATE.2014.140

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-25

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  - conf/date/RiefertCSBRB14
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  - https://dblp.org/rec/conf/date/RiefertCSBRB14
Andreas Riefert, Lyl M. Ciganda, Matthias Sauer, Paolo Bernardi, Matteo Sonza Reorda, Bernd Becker:
An effective approach to automatic functional processor test generation for small-delay faults. DATE 2014: 1-6

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