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"Critical Path Isolation and Bit-Width Scaling Are Highly Compatible for ..."

Yutaka Masuda et al. (2021)

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DOI: 10.23919/DATE51398.2021.9473946

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-21

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  dblp key:
  - conf/date/MasudaNCIMH21
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Yutaka Masuda, Jun Nagayama, TaiYu Cheng, Tohru Ishihara, Yoichi Momiyama, Masanori Hashimoto:
Critical Path Isolation and Bit-Width Scaling Are Highly Compatible for Voltage Over-Scalable Design. DATE 2021: 1260-1265

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