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"Fault Model Analysis of DRAM under Electromagnetic Fault Injection Attack."

Qiang Liu, Longtao Guo, Honghui Tang (2023)

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DOI: 10.23919/DATE56975.2023.10137146

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-07

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Qiang Liu, Longtao Guo, Honghui Tang:
Fault Model Analysis of DRAM under Electromagnetic Fault Injection Attack. DATE 2023: 1-6

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