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"Efficient and accurate method for intra-gate defect diagnoses in nanometer ..."

Aymen Ladhar, Mohamed Masmoudi, Laroussi Bouzaida (2009)

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DOI: 10.1109/DATE.2009.5090808

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/date/LadharMB09
Aymen Ladhar, Mohamed Masmoudi, Laroussi Bouzaida:
Efficient and accurate method for intra-gate defect diagnoses in nanometer technology and volume data. DATE 2009: 988-993

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