"Generation of compact test sets with high defect coverage."

Xrysovalantis Kavousianos, Krishnendu Chakrabarty (2009)

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DOI: 10.1109/DATE.2009.5090833

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Xrysovalantis Kavousianos, Krishnendu Chakrabarty:
Generation of compact test sets with high defect coverage. DATE 2009: 1130-1135

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