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ORCID"A gate level methodology for efficient statistical leakage estimation in ..."
Smriti Joshi et al. (2013)
- Smriti Joshi, Anne Lombardot, Marc Belleville, Edith Beigné, Stéphane Girard
:
A gate level methodology for efficient statistical leakage estimation in complex 32nm circuits. DATE 2013: 1056-1057
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