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"Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault ..."

Hideyuki Ichihara, Tomoo Inoue (2003)

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DOI: 10.1109/DATE.2003.10057

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/date/IchiharaI03
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  persistent URL:
  - https://dblp.org/rec/conf/date/IchiharaI03
Hideyuki Ichihara, Tomoo Inoue:
Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG. DATE 2003: 11180-11181

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