"CMOS open defect detection by supply current test."

Masaki Hashizume et al. (2001)

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DOI: 10.1109/DATE.2001.915071

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada:
CMOS open defect detection by supply current test. DATE 2001: 509

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